Research on the combination of improved Sobel operator and ant colony algorithm for defect detection

There are many aspects in the defect detection system. Any deviation any link will affect accuracy of final detection, and edge is very important image preprocessing stage. In this paper, a new algorithm proposed. Firstly, improved Sobel operator used to detect contour, then position contour taken as initial ant colony algorithm. The experimental results show that can extract with uniform thickness length from original collected by industrial camera, running time almost same traditional algorithm, thus providing more accurate data for products later